Invitation to industry members to submit 1-page extended abstract to 29th IEEE ATS 2020


Dear industry members of IEEE Malaysia,

I would like to personally invite you to submit a 1-page extended abstract to the 29th IEEE ATS 2020, which will submitted to IEEEXplore for publication. At the conference, you will have the opportunity to share your work in an oral presentation and get the chance to meet with the giants of the global test community not limited to the keynote speakers listed below. If the deadline is too tight and need additional time, do reach out to me personally.


Submission Deadline Extended (industry paper)!

29th IEEE Asian Test Symposium (ATS 2020)

22-25 November 2020, Malaysia

(Virtual Conference)

I apologize if there are multiple postings of this message. I would like to personally invite you to submit a 1-page abstract for presentation at the upcoming Asian Test Symposium. Based on the requests received, the organizing committee has decided to extend the paper submission deadline for industry abstracts as follows. Fyi, the accepted extended abstracts will be submitted to IEEEXplore for publication.

Submission deadline (PDF paper of 1-page extended abstract):                August 17, 2020

IEEE Computer Society’s Test Technology Technical Council (TTTC) and IEEE Council on Electronic Design Automation (CEDA) jointly organize the 29th IEEE ATS 2020. For the first time, ATS will be held as a virtual conference in Malaysia, on November 22-25, 2020.

The conference will be held in both synchronous and asynchronous formats. The synchronous event will be conducted for 4 days covering the tutorials, keynote talks, industry forums, invited talks and doctoral thesis award program. The technical paper presentations and industry paper presentations will be conducted as an asynchronous interactive event which will span outside of the 4-day program through our virtual conference platform. The registration fees to this virtual conference has also been updated on the website.

Industry practitioners are invited to submit original 1-page extended abstract on the innovative work and state-of-the-art experience to for presentation and publication in ATS 2020. Submission guidelines are provided at the conference website I invite you to also share this call for papers with your colleagues.

Keynote Speakers

ATS’20 KeynoteDr Yervant ZorianTitle: Robustness Challenges in the Internet of ThingsATS’20 KeynoteProf. Dr. Said HamdiouiTitle: Computation-In-Memory Architectures based on NV devices: Opportunities and ChallengesATS’20 KeynoteMr. Kam Heng LeeVice President & General Manager, Intel Manufacturing Product Engineering (Malaysia) and High-Volume EngineeringWRTLT’20 KeynoteDr Davide AppelloTitle: Using SLT to Screen Automotive Products: Test the IC in the System before the System Tests your IC

ATS 2020 Sister Event

Workshop on RTL and High Level Testing (WRTLT 2020)

In recognition of your support on contributing quality papers and participation in ATS, for the very first time, we include our sister event WRTLT 2020 as part of ATS2020 technical programme exclusively for all the ATS2020 authors!

The workshop aims to encourage the presentation and discussion of truly innovative and ”out-of-the-box” ideas aimed at addressing the challenges of high level test. We hope and expect this workshop will provide an ideal forum for discussion on this important topic for future system-on-a-chip (SoC) devices.

Thank you.

Best regards,

Fawnizu Azmadi Hussin, PhD SMIEEE

General Chair, 29th IEEE Asian Test Symposium 2020 in Malaysia

Chair, IEEE Malaysia Section |

Conference Website: