Invited Speaker 1

Professor Ilia Polian

Director of the Institute for Computer Architecture and Computer Engineering at the University of Stuttgart, Germany

Title: Exploring the Mysteries of System-Level Test

Abstract:

System-level test, or SLT, is an increasingly important process step in today’s integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.

Biography:

Ilia Polian is a Full Professor and the Director of the Institute for Computer Architecture and Computer Engineering at the University of Stuttgart, Germany. He received his Diplom (MSc) and PhD degrees from the University of Freiburg, Germany, in 1999 and 2003, respectively. Prof. Polian co-authored over 200 scientific publications and received two Best Paper Awards. He is a Senior Member of IEEE. Prof. Polian is the Speaker of DFG’s Priority Program 2253 “Nano Security” and a Director of Gradute School “Intelligent Methods for Test and Reliablity” in Stuttgart (funded by Advantest). His scientific interest include hardware-oriented security, emerging architectures, test methods, and quantum computing.