The Asian Test Symposium (ATS) provides an open forum dedicated to the electronic test of devices, boards, and systems—covering the complete test cycle from design verification, design-for-test, design-for-manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

The main goal of IEEE Asian Test Symposium 2020 is to promote discussions and scientific exchange of knowledge between researchers, engineers, developers, academicians and students. ATS 2020 hopes to address design, test , validation methodologies and yield challenges faced by industry towards to industry 4.0 with collaboration efforts of academia,design tool and equipment suppliers, designers and test engineer.

The 29th IEEE Asian Test Symposium (ATS’20) is to be organized at Penang, Malaysia, during November 22-25, 2020.

The theme for the ATS 2020 is "Testing of internet-of-things in the era industry 4.0". The organizing committee of ATS 2020 invites you to Penang Island "Pearl of the orient".

Key Dates & Deadlines

Submission deadline (PDF paper): July 28, 2020, 23:59 Malaysia time (GMT +8.00)
Industry paper: Aug 10, 2020, 23:59 Malaysia time (GMT +8.00)
Notification of acceptance: Sept 1, 2020
Camera-ready manuscript: Oct 1, 2020